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EXAFS and Near Edge Structure III O.P Haltbarkeit und Verschleiß bestimmt

SKU 76297433294
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Description

Haltbarkeit und Verschleiß bestimmt

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Grundprinzipien

EXAFS and Near Edge Structure III O.P Haltbarkeit und Verschleiß bestimmtThis volume contains the Proceedings of the Third International EXAFS Conference, hosted by Stanford University and the Stanford Synchrotron Radiation Laboratory on July 16 20, 1984. The meeting, co chaired by Professors Arthur Bienenstock and Keith Hodgson, was attended by over 200 scientists representing a wide range of scientific disciplines. The format of the meeting consisted of 51 invited presenta tions and four days of poster sessions. This

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